Optical Trajectory Manipulations Using the Self-Written Waveguide Technique.

Polymers (Basel)

School of Electrical and Electronic Engineering, College of Engineering and Architecture, University College Dublin, D 4 Dublin, Ireland.

Published: June 2020

This study is novel for several reasons: We used a thin drop cast layer of dry photosensitive materials to study the behaviors of wet photopolymer media using microscopic distances during the Self-Written Waveguide (SWW) process; then, we examined the self-trajectories formed inside the solid material. The results provide a framework for theoretical and experimental examinations by handling the effects of manipulating the alignment of fibers. The other main advantage of these techniques is their lightweight, easy to process, highly flexible, and ultimately low-cost nature. First, the SWW process in wet photopolymer media (liquid solutions) was examined under three cases: single-, counter-, and co-fiber exposure. Then, the SWWs formed inside the solid material were examined along with the effects of manipulating the alignment of the fibers. In all cases, high precision measurements were used to position the fiber optic cables (FOCs) before exposure using a microscope. The self-writing process was indirectly monitored by observing (imaging) the light emerging from the side of the material sample during SWW formation. In this way, we examined the optical waveguide trajectories formed in Acrylamide/Polyvinyl Alcohol (AA/PVA), a photopolymer material (sensitized at 532 nm). First, the transmission of light by this material is characterized. Then, the bending and merging of the waveguides that occur are investigated. The predictions of our model are shown to qualitatively agree with the observed trajectories. The largest index changes taking place at any time during exposure, i.e., during SWW formation, are shown to take place at the positions where the largest exposure light intensity is present. Typically, such maxima exist close to the input face. The first maximum is referred to as the location of the . Other local maxima also appear further along the SWW and are referred to as , i.e., eyes deeper within the material.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7408574PMC
http://dx.doi.org/10.3390/polym12071438DOI Listing

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