The paper presents scanning electron microscopy (SEM) studies on the magnetic domain structure (DS) using magnetic colloid. The possibility of colloid-SEM method for observing the DS of mono- and polycrystalline samples in the secondary (SEI) and backscattered electrons modes (BEC) is demonstrated. Owing to the large focal depth of SEM, it is possible to observe the overall DS and fine features, even in unpollished samples.
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| http://dx.doi.org/10.1016/j.micron.2020.102899 | DOI Listing |
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