A general and robust analytical method for interface normal determination in TEM.

This paper presents a new analytical method to determine interface normals from a series of bright/dark field images taken from arbitrary orientations. This approach, based on a general geometrical model of interface projection, provides a generalized formulation of existing methods. It can treat an excessive number of inputs, i.e. orientation conditions. Given 6 or more sets of inputs, even with considerable experimental errors, we prove that this method is still very likely to yield results with satisfactory accuracy. The robustness of the method can thus allow its implementation in problems dealing with a large amount of data. We show that this method can also be applied to determine 1D features or to check the planarity of microstructural features.