Three possible data collection configurations for electrical impedance tomography are considered. These are serial current but parallel voltage measurement or full parallel operations. Measurement errors due to stray capacitances, common mode signals and contact impedance are considered. It is concluded that a parallel system offers advantages in terms of either speed or signal to noise ratio by may give larger common mode errors.
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| http://dx.doi.org/10.1088/0143-0815/9/4a/016 | DOI Listing |
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