Characterization of e-beam evaporated Ge, YbF, ZnS, and LaF thin films for laser-oriented coatings.

Thin films of Ge, ZnS, , and produced using e-beam evaporation on ZnSe and Ge substrates were characterized in the range of 0.4-12 µm. It was found that the Sellmeier model provides the best fit for refractive indices of ZnSe substrate, ZnS, and films; the Cauchy model provides the best fit for film. Optical constants of Ge substrate and Ge film as well as extinction coefficients of ZnS, , , and ZnSe substrate are presented in the frame of a non-parametric model. For the extinction coefficient of ZnS, the exponential model is applicable. Stresses in Ge, ZnS, , and were estimated equal to (-50), (-400), 140 MPa, and 380 MPa, respectively. The surface roughness does not exceed 5 nm for all films and substrates.