A silicon nitride micro-ring resonator with a loaded Q factor of 1.4 × 10 at 780 nm wavelength is demonstrated on silicon substrates. This is due to the low propagation loss waveguides achieved by optimization of waveguide sidewall interactions and top cladding refractive index. Potential applications include laser frequency stabilization allowing for chip-scale atomic systems targeting the Rb atomic transition at 780.24 nm. The temperature dependent wavelength shift of the micro-ring was determined to be 13.1 pm/K indicating that a minimum temperature stability of less than ±15 mK is required for such devices for wavelength locking applications. If a polyurethane acrylate top cladding of an optimized thickness is used then the micro-ring could effectively be athermal, resulting in reduced footprint, power consumption, and cost of potential devices.

Download full-text PDF

Source
http://dx.doi.org/10.1364/OE.381224DOI Listing

Publication Analysis

Top Keywords

micro-ring resonator
8
780 nm wavelength
8
chip-scale atomic
8
atomic systems
8
top cladding
8
factor sin
4
micro-ring
4
sin micro-ring
4
resonator 780 nm
4
wavelength
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!