A novel wireless sample temperature control system for field ion, field electron, and atom probe techniques.

A novel sample temperature control system for field ion microscopy (FIM), field electron microscopy (FEM), and atom probe techniques based on wireless data transmission was designed, built, and applied for FIM and FEM studies of surface reactions. The system solves the longstanding problem of the temperature control of micrometer- to nanometer-sized samples during the operation in field emission based techniques. The new system can also be used for other applications requiring the specimen to be under high electric potential (tens of kilovolts or even higher). The chosen case studies of nanocatalysis demonstrate the capabilities and superior performance of the new temperature control system.