AI Article Synopsis
- Accurately retrieving local phase gradients from intensity fringe shifts is crucial for grating-based x-ray phase contrast imaging.
- The study explores the mathematical connection between these fringe shifts and sample phase gradients in dual phase grating interferometry.
- The authors derive formulas that not only clarify this relationship but also serve as a tool for optimizing the design of dual phase grating interferometers.
Article Abstract
One of the key tasks in grating based x-ray phase contrast imaging is to accurately retrieve local phase gradients of a sample from measured intensity fringe shifts. To fulfill this task in dual phase grating interferometry, one needs to know the exact mathematical relationship between the two. In this work, using intuitive analysis of the sample-generated fringe shifts based on the beat pattern formation mechanism, the authors derived the formulas relating sample phase gradients to fringe phase shifts. These formulas provide also a design optimization tool for dual phase grating interferometry.
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Source |
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7046035 | PMC |
| http://dx.doi.org/10.1364/OE.27.035437 | DOI Listing |
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