This paper describes a new type of multifacet echelle grating (MFEG) for use in an echelle spectrometer. This new type of echelle grating broadens the spectral distribution on the spectral plane. We built a geometric model of MFEG to analyze the influence of the blaze angle and number of facet shapes on the spectral evolution. A dual-facet echelle grating and a four-facet echelle grating with different parameters were fabricated by rotating ion-beam etching with a self-shadowing rotating mask, based on the existing single-facet echelle grating (SFEG) with a line density of 52.7 g/mm and a blaze angle of 63.5°. The distributions of diffraction efficiency for different orders were measured with a He-Ne laser (632.8 nm); furthermore, these echelle gratings were applied in an echelle spectrometer (ICP-OES, Plasma2000), and testing spectra were obtained. The experimental results demonstrate that the MFEG can broaden the intensity distribution on the spectral plane, overcoming the weak spectral margin signal of SFEG spectrometers.
We propose a spatial heterodyne Raman spectrometer (SHRS) based on a field-widened grating-echelle (FWGE). A normal grating is combined with an echelle grating in a conventional spatial heterodyne spectrometer to eliminate ghost images without using masks, and prevents interference among the spatial frequencies of different diffraction orders. Mathematical expressions and derivation processes are given for the spectral parameters in the FWGE-SHRS and a verification breadboard system is fabricated.
Alignment of mosaic gratings is traditionally supported by two interferometric verifications: on the zero order to verify the grating surfaces and on the blaze to verify the groove direction. In the case of low frequency echelle grating an interferometric measurement on the zero order is hardly feasible due to extremely low contrast of the fringes. The complete alignment has then to be carried out on high order (close to the blaze) where the two misalignment errors (the tip and rotation) show the same effect on the interferogram.
We present a spectral-scanning frequency-modulated continuous wave (FMCW) 3D imaging system capable of producing high-resolution depth maps with an extended field of view (FOV). By employing a multipass configuration with an echelle grating, the system achieves an FOV of 5.5° along the grating axis.
Tool wear is one of the main causes of failure during diffraction grating ruling. However, no theoretical model for tool wear analysis has been available to date. A mathematical model is established here to solve for the friction coefficient at the tool contact position for the first time.
Microplastic pollution has become a global environmental problem that cannot be ignored. Raman spectroscopy has been widely used for microplastics detection because it can be performed in real-time and is non-destructive. Conventional detection techniques have had weak signals and low signal-to-noise ratios (SNR).
