We develop a compact, high signal-to-noise ratio line-detector array Compton scatter imaging system based on YSiO scintillators and silicon photomultipliers. It is shown that the system's response uniformity is better than 98% for low-Z materials after a specific correction. Backscatter images of an "IHEP"-character model, cubes of different materials, and some other applications are presented, to show its potential for use in nondestructive testing.
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| http://dx.doi.org/10.1016/j.apradiso.2019.108845 | DOI Listing |
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