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An atomic force microscope tip designed to measure time-varying nanomechanical forces.
Nat Nanotechnol
August 2007
Rowland Institute at Harvard, Cambridge, Massachusetts 02142, USA.
Tapping-mode atomic force microscopy (AFM), in which the vibrating tip periodically approaches, interacts and retracts from the sample surface, is the most common AFM imaging method. The tip experiences attractive and repulsive forces that depend on the chemical and mechanical properties of the sample, yet conventional AFM tips are limited in their ability to resolve these time-varying forces. We have created a specially designed cantilever tip that allows these interaction forces to be measured with good (sub-microsecond) temporal resolution and material properties to be determined and mapped in detail with nanoscale spatial resolution.
View Article and Find Full Text PDFRevealing the hidden atom in graphite by low-temperature atomic force microscopy.
Proc Natl Acad Sci U S A
October 2003
Institute of Physics, Electronic Correlations and Magnetism, Experimentalphysik VI, Universität Augsburg, Universitätsstrasse 1, D-86135 Augsburg, Germany.
Carbon, the backbone material of life on Earth, comes in three modifications: diamond, graphite, and fullerenes. Diamond develops tetrahedral sp3 bonds, forming a cubic crystal structure, whereas graphite and fullerenes are characterized by planar sp2 bonds. Polycrystalline graphite is the basis for many products of everyday life: pencils, lubricants, batteries, arc lamps, and brushes for electric motors.
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