Runaway electron imaging spectrometry (REIS) system.

Rev Sci Instrum

ENEA, Dipartimento FSN, C. R. Frascati, Via E. Fermi 45, 00044 Frascati (Roma), Italy.

Published: July 2019

AI Article Synopsis

  • A portable Runaway Electron Imaging and Spectrometry System (REIS) has been developed to analyze synchrotron radiation from runaway electrons in tokamaks.
  • The REIS utilizes a wide-angle optical setup with fiber optics to capture visible and infrared spectra from 500 nm to 2500 nm, and it can take visible images at 25 frames per second using a CCD microcamera.
  • The system operates through a LabVIEW program, allowing data acquisition from three spectrometers every 20 ms, with the option to configure the timing to as little as 10 ms, and the paper discusses the REIS architecture, data acquisition, and experimental results from FTU.

Article Abstract

A portable Runaway Electron Imaging and Spectrometry System (REIS) was developed in ENEA-Frascati to measure synchrotron radiation spectra from in-flight runaway electrons in tokamaks. The REIS is a wide-angle optical system collecting simultaneously visible and infrared emission spectra using an incoherent bundle of fibers, in a spectral range that spans from 500 nm to 2500 nm, and visible images using a CCD color microcamera at a rate of 25 frames/s. The REIS system is supervised and managed using a dedicated LabVIEW program to acquire data simultaneously from three spectrometers every 20 ms (configurable down to 10 ms). An overview of the REIS architecture and acquisition system and resulting experimental data obtained in FTU are presented and discussed in this paper.

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http://dx.doi.org/10.1063/1.5061833DOI Listing

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