Atomically resolved probe-type scanning tunnelling microscope for use in harsh vibrational cryogen-free superconducting magnet.

Ultramicroscopy

Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory of the Chinese Academy of Sciences, Hefei, Anhui 230031, People's Republic of China; CASmF Sci.&Tech. Ltd. (), Hefei, Anhui 230088, People's Republic of China; Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China; Collaborative Innovation Center for Artificial Microstructure and Quantum Control, Nanjing University, Nanjing 210093, People's Republic of China; Anhui Laboratory of Advanced Photon Science and Technology, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China. Electronic address:

Published: October 2019

We present a probe-type scanning tunnelling microscope (STM) with atomic resolution that is designed to be directly inserted and work in a harsh vibrational cryogen-free superconducting magnet system. When a commercial variable temperature insert (VTI) is installed in the magnet and the STM is housed in the VTI, a lowest temperature of 1.6 K can be achieved, at which the STM still operates well. We tested the STM in an 8 T superconducting magnet cooled with a pulse-tube cryocooler and obtained atomically resolved graphite and NbSe images as well as the scanning tunnelling spectrum (i.e., dI/dV spectrum) data of the latter near its critical temperature, which show the formation process of the superconducting gap as a function of temperature. The drifting rates of the STM at 1.6 K in the X-Y plane and Z direction are 1.15 and 1.71 pm/min, respectively. Noise analysis for the tunnelling current shows that the amplitudes of the dominant peaks (6.84 and 10.25 Hz) are as low as 1.5 pA.Hz when we set the current to 0.5 nA and open the feedback loop. This is important as a cryogen-free magnet system has long been considered too harsh for any atomic resolution measurement.

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http://dx.doi.org/10.1016/j.ultramic.2019.06.006DOI Listing

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