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http://dx.doi.org/10.11323/jjmp.39.1_29 | DOI Listing |
Sci Adv
March 2024
Russell Berrie Nanotechnology Institute, Technion-Israel Institute of Technology, Haifa, Israel.
Accurate characterization of the microscopic point spread function (PSF) is crucial for achieving high-performance localization microscopy (LM). Traditionally, LM assumes a spatially invariant PSF to simplify the modeling of the imaging system. However, for large fields of view (FOV) imaging, it becomes important to account for the spatially variant nature of the PSF.
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