One-shot recording of the instantaneous change in the refractive index of bulk semiconductors exposed to pulsed radiation by a Fabry-Perot-like interferometer.

An interferometer, directly coupling a single-mode fiber with a bulk semiconductor, was used to one-shot record the instantaneous change in the refractive index of bulk semiconductors. A practical contrast level can be achieved in the interferometer with different types of polished bulk materials several hundred micrometers in thickness. The temporal resolution was approximately 50 ps and can be improved by using thinner materials or higher bandwidth detection. This interferometer can also be used to study the fast recording technology based on pulsed radiation-induced changes in optical characteristics.