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An examination of scaling behavior in unstable epitaxial mound growth via kinetic Monte Carlo simulations. | LitMetric

An examination of scaling behavior in unstable epitaxial mound growth via kinetic Monte Carlo simulations.

J Phys Condens Matter

Department of Mathematics, University of California, Los Angeles, CA 90095, United States of America. Department of Science, Technology and Mathematics, Gallaudet University, Washington, DC 20002, United States of America.

Published: September 2019

AI Article Synopsis

  • The study examines how mounds on crystal surfaces change over time during unstable growth, focusing on roughening and coarsening behaviors.
  • The researchers used kinetic Monte Carlo simulations for two lattice-gas models and discovered that scaling exponents, which describe these behaviors, are influenced by factors like step edge barriers and transport mechanisms.
  • Findings reveal a continuous variation in these exponents based on surface current, highlighting the complex interaction between barrier strength and kinetic processes during crystal growth.

Article Abstract

We investigate the scaling behavior for roughening and coarsening of mounds during unstable epitaxial growth. By using kinetic Monte Carlo (KMC) simulations of two lattice-gas models of crystal surfaces, we find scaling exponents that characterize roughening and coarsening at long times. Our simulation data show that these exponents have a complicated dependence on key model parameters that describe a step edge barrier and downward transport mechanisms. This behavior has not been fully described in previous works. In particular, we find that these scaling exponents vary continuously with parameters controlling the surface current. The kinetic processes of the KMC models that we employ include surface diffusion, edge diffusion, step-edge barriers, and also account for transient kinetics during deposition via downward funneling and transient mobility. Our extensive simulations make evident the salient interplay between step-edge barrier strength and transient kinetic processes.

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Source
http://dx.doi.org/10.1088/1361-648X/ab20b3DOI Listing

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