Nitrogen-doped lithium niobate (LiNbO₃:N) thin films were successfully fabricated on a Si-substrate using a nitrogen plasma beam supplied through a radio-frequency plasma apparatus as a dopant source via a pulsed laser deposition (PLD). The films were then characterized using X-Ray Diffraction (XRD) as polycrystalline with the predominant orientations of (012) and (104). The perfect surface appearance of the film was investigated by atomic force microscopy and Hall-effect measurements revealed a rare p-type conductivity in the LiNbO₃:N thin film. The hole concentration was 7.31 × 10 cm with a field-effect mobility of 266 cm²Vs. X-ray Photoelectron Spectroscopy (XPS) indicated that the atom content of nitrogen was 0.87%; N atoms were probably substituted for O sites, which contributed to the p-type conductivity. The realization of p-type LiNbO₃:N thin films grown on the Si substrate lead to improvements in the manufacturing of novel optoelectronic devices.
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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6427647 | PMC |
http://dx.doi.org/10.3390/ma12050819 | DOI Listing |
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