Simultaneous Silicon Oxide Growth and Electrophoretic Deposition of Graphene Oxide.

Langmuir

Laboratory of Food Process Engineering , Wageningen University, Bornse Weilanden 9 , 6708 WG Wageningen , The Netherlands.

Published: March 2019

AI Article Synopsis

  • The electrophoretic deposition process of graphene oxide (GO) on silicon substrates results in the formation of a three-layered material due to simultaneous silicon anodic oxidation.
  • Scanning electron microscopy and X-ray photoelectron spectroscopy confirm the presence of GO sheets, with varying carbon levels depending on the angle and voltage applied, indicating a thin carbon layer formation.
  • The observed shifts in Si 2p peaks and the increase in oxygen content suggest significant oxide layer formation during GO deposition, implying that silicon oxidation may influence the interpretation of GO’s effects.

Article Abstract

During electrophoretic deposition of graphene oxide (GO) sheets on silicon substrates, not only deposition but also simultaneous anodic oxidation of the silicon substrate takes place, leading to a three-layered material. Scanning electron microscopy images reveal the presence of GO sheets on the silicon substrate, and this is also confirmed by X-ray photoelectron spectroscopy (XPS), albeit that the carbon portion increases with increasing emission angle, hinting at a thin carbon layer. With increasing applied potential and increasing conductivity of the GO solution, the carbon signal decreases, whereas the overall thickness of the added layer formed on top of the silicon substrate increases. Through XPS spectra in which the Si 2p peaks shifted under those conditions to 103-104 eV, we were able to conclude that significant amounts of oxygen are present, indicative of the formation of an oxide layer. This leads us to conclude that GO can be deposited using electrophoretic deposition, but that at the same time, silicon is oxidized, which may overshadow effects previously assigned to GO deposition.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6418871PMC
http://dx.doi.org/10.1021/acs.langmuir.8b03139DOI Listing

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