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Characterization of Wheat-Triticale Lines Resistant to Powdery Mildew, Stem Rust, Stripe Rust, Wheat Curl Mite, and Limitation on Spread of WSMV. | LitMetric

High yield potential and the wide adaptability of wheat-rye T1BL·1RS translocation lines are attractive to breeders. The wheat-rye lines Lankao 1, 3, 4, and 5 were resistant to a wide spectrum of wheat powdery mildew (Blumeria graminis f. sp. tritici) isolates from both China and Canada. They also were resistant to a mixture of wheat stem rust (Puccinia graminis f. sp. tritici) pathotypes (98WSR) and wheat stripe rust (P. striiformis f. sp. tritici) races from western Canada and China. Colonization of wheat curl mite (WCM) (Aceria tosichella) resulted in slower development of rolling and trapping leaves in the Lankao lines than in the WCM-susceptible check cultivars. The delayed development of Wheat streak mosaic (WSM) symptoms on Lankao lines was observed when transmitted by viruliferous WCM, even though they were susceptible to Wheat streak mosaic virus (WSMV). This effect of Lankao lines on limiting the spread of WSM was comparable with other known sources of WCM resistance. Sequential C-banding and genomic in situ hybridization analyses revealed the presence of a pair of T1BL·1RS translocated chromosomes in the Lankao lines. Segregation analysis of the F progeny plants derived from crosses between Lankao 4 and the susceptible wheat cvs. Mingxian 169 and Lovrin 13 indicated that a single dominant gene was responsible for the isolate-specific resistance against wheat powdery mildew in Lankao 4. Polymerase chain reaction analysis using an STS marker amplified rye chromatin in powdery mildew-resistant and -susceptible F plants of the Mingxian 169 × Lankao 4 cross demonstrated that the resistance of Lankao 4 was not controlled by a gene or genes located on the rye chromosome arm of T1BL·1RS. The resistance of the Lankao lines to diseases and limitation of the spread of WSMV, in combination with good quality and high yield potential, makes them useful for wheat improvement and production.

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http://dx.doi.org/10.1094/PDIS-91-4-0368DOI Listing

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