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Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research. | LitMetric

Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research.

Front Neuroanat

Carl Zeiss Microscopy GmbH, Oberkochen, Germany.

Published: December 2018

Major progress has been achieved in recent years in three-dimensional microscopy techniques. This applies to the life sciences in general, but specifically the neuroscientific field has been a main driver for developments regarding volume imaging. In particular, scanning electron microscopy offers new insights into the organization of cells and tissues by volume imaging methods, such as serial section array tomography, serial block-face imaging or focused ion beam tomography. However, most of these techniques are restricted to relatively small tissue volumes due to the limited acquisition throughput of most standard imaging techniques. Recently, a novel multi-beam scanning electron microscope technology optimized to the imaging of large sample areas has been developed. Complemented by the commercialization of automated sample preparation robots, the mapping of larger, cubic millimeter range tissue volumes at high-resolution is now within reach. This Mini Review will provide a brief overview of the various approaches to electron microscopic volume imaging, with an emphasis on serial section array tomography and multi-beam scanning electron microscopic imaging.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6297274PMC
http://dx.doi.org/10.3389/fnana.2018.00112DOI Listing

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