: a new tool to simulate and fit X-ray diffractograms of oxide thin films and heterostructures.

J Appl Crystallogr

DQMP, University of Geneva, 24 Quai Ernest Ansermet, Geneva 4, 1211, Switzerland.

Published: December 2018

is a custom-made MATLAB program that calculates the X-ray diffracted intensity for oxide thin films and heterostructures based on a library of inorganic materials.

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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6276276PMC
http://dx.doi.org/10.1107/S1600576718012840DOI Listing

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