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Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. | LitMetric
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Cluster secondary ion emission of silicon: An influence of the samples' dimensional features.

Alexander Tolstogouzov Mikhail N Drozdov Sergey F Belykh Gennady P Gololobov Alexei E Ieshkin Paul Mazarov Dmitriy V Suvorov Dejun Fu Vasiliy Pelenovich Xiaomei Zeng Wenbin Zuo

Rapid Commun Mass Spectrom

Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics, School of Physics and Technology, Wuhan University, 430072, Wuhan, China.

Published: February 2019

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 Source
http://dx.doi.org/10.1002/rcm.8345DOI Listing

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