Carbon (C) doping is essential for producing semi-insulating GaN for power electronics. However, to date the nature of C doped GaN, especially the lattice site occupation, is not yet well understood. In this work, we clarify the lattice site of C in GaN using polarized Fourier-transform infrared and Raman spectroscopies, in combination with first-principles calculations. Two local vibrational modes (LVMs) at 766 and 774 cm^{-1} in C doped GaN are observed. The 766 cm^{-1} mode is assigned to the nondegenerate A_{1} mode vibrating along the c axis, whereas the 774 cm^{-1} mode is ascribed to the doubly degenerate E mode confined in the plane perpendicular to the c axis. The two LVMs are identified to originate from isolated C_{N}^{-} with local C_{3v} symmetry. Experimental data and calculations are in outstanding agreement both for the positions and the intensity ratios of the LVMs. We thus provide unambiguous evidence of the substitutional C atoms occupying the N site with a -1 charge state in GaN and therefore bring essential information to a long-standing controversy.
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http://dx.doi.org/10.1103/PhysRevLett.121.145505 | DOI Listing |
Sci Rep
June 2024
Institute of High Pressure Physics of the Polish Academy of Sciences, ul. Sokołowska 29/37, 01-142, Warsaw, Poland.
The properties and concentrations of deep-level defects induced by implantations of Si and Mg ions into unintentionally doped (UID) epitaxial GaN have been revealed by using the Laplace-transform photoinduced transient spectroscopy (LPITS) and molecular dynamics (MD) calculations. The material lattice damage, produced by the Si ions implanted at room temperature in the single process at the energies of 200 and 340 keV, is compared with that produced by the Mg ions implanted in the similar process at the energies of 150, 210, and 270 keV. The LPITS results indicate that the same deep traps with the activation energies of 396, 512, 531, 587, 635, and 736 meV are present in the tail regions of the semi-insulating Si- and Mg-implanted films.
View Article and Find Full Text PDFMaterials (Basel)
March 2024
Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland.
The formation of intrinsic point defects in the N-sublattice of semi-insulating Mg-doped GaN crystals grown by the ammonothermal method (SI AT GaN:Mg) was investigated for the first time. The grown-in defects produced by the displacement of nitrogen atoms were experimentally observed as deep traps revealed by the Laplace transform photoinduced transient spectroscopy in the compensated -type crystals with the Mg concentrations of 6 × 10 and 2 × 10 cm and resistivities of ~10 Ωcm and ~10 Ωcm, respectively. In both kinds of materials, three closely located traps with activation energies of 430, 450, and 460 meV were revealed.
View Article and Find Full Text PDFUltrasonics
July 2023
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China. Electronic address:
Surface acoustic wave (SAW) filter with a low insertion loss (IL) of 4.415 dB has been demonstrated on Carbon-doped semi-insulating c-plane bulk GaN without external lumped element matching. The center frequency, 3 dB bandwidth, out-of-band attenuation, return loss of the filter are 477.
View Article and Find Full Text PDFACS Appl Electron Mater
August 2022
College of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203-3613, United States.
Beryllium has been considered a potential alternative to magnesium as a p-type dopant in GaN, but attempts to produce conductive p-GaN:Be have not been successful. Photoluminescence studies have repeatedly shown Be to have an acceptor level shallower than that of Mg, but deep Be defects and other compensating defects render most GaN:Be materials n-type or semi-insulating at best. Previous reports use molecular beam epitaxy or ion implantation to dope GaN with Be, almost exclusively.
View Article and Find Full Text PDFSmall
May 2022
Department of Physics, Chonnam National University, Gwangju, 61186, Republic of Korea.
Rapid development of micro-electromechanical systems increases the need for flexible and durable piezoelectric nanogenerators (f-PNG) with high output power density. In this study, a high-performance, flexible, and highly stable f-PNG is prepared by directly growing the Mg-doped semi-insulating GaN nanowires (NWs) on a 30-µm-thick tungsten foil using vapor-liquid-solid growth mechanism. The direct growth of NWs on metal foil extends the overall lifetime of the f-PNG.
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