The concept and the implementation of a compact and simplified echelle spectrometer are presented, and the working principle is demonstrated by first experimental measurements. The crucial element of the setup is a cross-grating, combining an echelle grating utilizing several higher diffraction orders (5th up to 11th) and a superposed perpendicular-oriented cross-dispersing grating. Two alternative manufacturing approaches for the cross-grating are presented and discussed. The first approach combines Talbot lithography for the deep echelle grating and interference lithography for the cross-dispersing structure. As a second approach, direct laser-beam writing was applied. The compact echelle spectrometer covers a spectral range from 380 to 700 nm and offers a spectral resolution of ∼2 .
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http://dx.doi.org/10.1364/AO.57.007109 | DOI Listing |
We propose a spatial heterodyne Raman spectrometer (SHRS) based on a field-widened grating-echelle (FWGE). A normal grating is combined with an echelle grating in a conventional spatial heterodyne spectrometer to eliminate ghost images without using masks, and prevents interference among the spatial frequencies of different diffraction orders. Mathematical expressions and derivation processes are given for the spectral parameters in the FWGE-SHRS and a verification breadboard system is fabricated.
View Article and Find Full Text PDFAngew Chem Int Ed Engl
August 2024
Kavli Nanoscience Institute and Department of Physics, California Institute of Technology, Pasadena, California, 91125, USA.
Nanoelectromechanical systems (NEMS)-based mass spectrometry (MS) is an emerging technique that enables determination of the mass of individual adsorbed particles by driving nanomechanical devices at resonance and monitoring the real-time changes in their resonance frequencies induced by each single molecule adsorption event. We incorporate NEMS into an Orbitrap mass spectrometer and report our progress towards leveraging the single-molecule capabilities of the NEMS to enhance the dynamic range of conventional MS instrumentation and to offer new capabilities for performing deep proteomic analysis of clinically relevant samples. We use the hybrid instrument to deliver E.
View Article and Find Full Text PDFSpectrochim Acta A Mol Biomol Spectrosc
May 2024
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, Jilin 130033, China; University of Chinese Academy of Sciences, Beijing 100049, China; National Engineering Research Center for Diffraction Gratings Manufacturing and Application, Changchun, Jilin 130033, China.
Microplastic pollution has become a global environmental problem that cannot be ignored. Raman spectroscopy has been widely used for microplastics detection because it can be performed in real-time and is non-destructive. Conventional detection techniques have had weak signals and low signal-to-noise ratios (SNR).
View Article and Find Full Text PDFWe present the concept and design of a novel integrated optical spectrometer able to operate over four different optical bands in the infrared that cover over 900 nm of aggregated bandwidth. The device, named integrated optical four bands spectrometer (IOFBS), consists of a single planar concave grating with 4 inputs waveguides, each corresponding to a different wavelength band, and 39 output channels that can be implemented on a silicon nitride platform. The inputs waveguides (IWGs) are optimized so that the echelle grating works in different diffraction orders to create constructive interference at the fixed output waveguides.
View Article and Find Full Text PDFSensors (Basel)
July 2023
Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, 17 Xinxi Road, Xi'an 710119, China.
We have developed a compact, asymmetric three-channel echelle spectrometer with remarkable high-spectral resolution capabilities. In order to achieve the desired spectral resolution, we initially establish a theoretical spectral model based on the two-dimensional coordinates of spot positions corresponding to each wavelength. Next, we present an innovative and refined method for precisely calibrating echelle spectrometers through parameter inversion.
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