ACS Appl Mater Interfaces
Department of Physics and Astronomy , University of Nebraska-Lincoln, Lincoln , Nebraska 68588-0299 , United States.
Published: June 2018
We report a more than 10-fold enhancement of the piezoelectric coefficient d of polycrystalline CHNHPbI (MAPbI) films when interfacing them with ferroelectric PbZrTiO (PZT). Piezoresponse force microscopy (PFM) studies reveal [Formula: see text] values of 0.3-0.4 pm/V for MAPbI deposited on Au, indium tin oxide, and SrTiO surfaces, with small phase angle fluctuating at length scales smaller than the grain size. In sharp contrast, on samples prepared on epitaxial PZT films, we observe large-scale polar domains exhibiting clear, close to 180° PFM phase contrasts, pointing to polar axes along the film normal. By separating the piezoresponse contributions from the MAPbI and PZT layers, we extract a significantly higher [Formula: see text] of ∼4 pm/V, which is attributed to the enhanced alignment of the MA molecular dipoles promoted by the unbalanced surface potential of PZT. We also discuss the effect of the interfacial screening layer on the preferred polar direction.
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http://dx.doi.org/10.1021/acsami.8b03403 | DOI Listing |
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