In this tutorial, we present a general model linking the data provided by any optical diffraction microscope to the sample permittivity. Our analysis is applicable to essentially all microscope configurations, in transmission or reflection mode, using scanning or full-field illumination, with or without interferometric measurements. We include also a generalization of our analysis to vector fields.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1364/JOSAA.35.000748 | DOI Listing |
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!