Stochastic Model of Breakdown Nucleation under Intense Electric Fields.

Phys Rev Lett

Racah Institute of Physics and the Center for Nanoscience and Nanotechnology, Hebrew University of Jerusalem, Jerusalem 9190401, Israel.

Published: March 2018

A plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.

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http://dx.doi.org/10.1103/PhysRevLett.120.124801DOI Listing

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