Backscattered electron imaging and elemental analysis of rapidly frozen plant cells using variable accelerating voltage.

Microscopy (Oxf)

Science & Medical System Service Div., Hitachi High-Tech Fielding Corporation, Kanagawa 213-0012, Japan.

Published: April 2018

Rapidly frozen rosemary leaves were observed at variable accelerating voltages in a low-vacuum scanning electron microscope equipped with a cryo transfer system. After water was sublimated from the fractured face of the leaf, distinct backscattered electron (BSE) images were obtained depending on the accelerating voltages applied. At 5 kV, surface cell wall structure was observed, whereas at 10 and 15 kV chloroplasts lining the inside of the cell wall and membrane were visualized. With energy dispersive X-ray microanalysis, elemental information corresponding to the BSE images was obtained. Besides visualization of the structures and elemental composition close to the living state, information on layers at different depths from the surface could be detected by varying the accelerating voltage in this system.

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Source
http://dx.doi.org/10.1093/jmicro/dfx133DOI Listing

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