Toward Practical, Subwavelength, Visible-Light Photolithography with Hyperlens.

ACS Nano

Electrical Engineering Department, University at Buffalo, The State University of New York, Buffalo, New York 14260, United States.

Published: January 2018

The future success of semiconductor technology relies on the continuing reduction of the feature size, allowing more components per chip and higher speed. Optical metamaterial-based hyperlens exhibit the ability for spatial pattern compression from the micro- to nanoscale, potentially addressing the ever-increasing demand of photolithograpy for inexpensive, all-optical nanoscale pattern recoding. Here, we demonstrate a photolithography system enabling a feature size of 80 nm using a 405 nm laser source. To realize such a system, we developed a fabrication method to obtain very thick hyperbolic metamaterial enabling a hyperlens with a very large demagnification rate of 3.75. Finally, we discuss several steps necessary to transform the proposed technique into a practical solution for the visible-light-based nanolithography. These include flattening of the inner surface of the hyperlens to increase the working area and integrating the proposed device into a conventional stepper system.

Download full-text PDF

Source
http://dx.doi.org/10.1021/acsnano.7b07185DOI Listing

Publication Analysis

Top Keywords

feature size
8
practical subwavelength
4
subwavelength visible-light
4
visible-light photolithography
4
hyperlens
4
photolithography hyperlens
4
hyperlens future
4
future success
4
success semiconductor
4
semiconductor technology
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!