AI Article Synopsis

  • Ultrafast pulse generation was achieved using a thulium-doped fiber laser mode-locked by WTe, showing key performance metrics with modulation depth, nonsaturable loss, and saturable intensity values of 31%, 34.3%, and 7.6 MW/cm respectively.
  • Stable soliton pulses were produced at a central wavelength of 1915.5 nm, featuring a pulse duration of 1.25 ps, an average output power of 39.9 mW, and an impressive signal-to-noise ratio of 95 dB.
  • This research marks the first successful use of WTe-based saturable absorbers in fiber lasers operating in the 2 μm wavelength range.

Article Abstract

Ultrafast pulse generation was demonstrated in a thulium-doped fiber laser mode-locked by magnetron-sputtering deposited WTe with a modulation depth, a nonsaturable loss, and a saturable intensity of 31%, 34.3%, and 7.6  MW/cm, respectively. Stable soliton pulses could be obtained at a 1915.5 nm central wavelength with a pulse duration of 1.25 ps, an average output power of 39.9 mW, and a signal-to-noise ratio of 95 dB. To the best of our knowledge, this was the first demonstration of WTe-based saturable absorbers in fiber lasers at a 2 μm regime.

Download full-text PDF

Source
http://dx.doi.org/10.1364/OL.42.005010DOI Listing

Publication Analysis

Top Keywords

magnetron-sputtering deposited
8
thulium-doped fiber
8
fiber laser
8
deposited wtefor
4
wtefor ultrafast
4
ultrafast thulium-doped
4
laser ultrafast
4
ultrafast pulse
4
pulse generation
4
generation demonstrated
4

Similar Publications

Monodisperse films of spherical tantalum oxide (V) nanoclusters and spherical tantalum nanoclusters with a tantalum oxide shell with diameters of 1.4-8 nm were obtained by magnetron sputtering. The size of the deposited nanoclusters was controlled using a quadrupole mass filter.

View Article and Find Full Text PDF

Self-assembled DNA origami lattices on silicon oxide surfaces have great potential to serve as masks in molecular lithography. However, silicon oxide surfaces come in many different forms and the type and history of the silicon oxide has a large effect on its physicochemical surface properties. Therefore, we here investigate DNA origami lattice formation on differently fabricated SiO films on silicon wafers after wet-chemical oxidation by RCA1.

View Article and Find Full Text PDF

Aluminum nitride (AlN) with a wide band gap (approximately 6.2 eV) has attractive characteristics, including high thermal conductivity, a high dielectric constant, and good insulating properties, which are suitable for the field of resistive random access memory. AlN thin films were deposited on ITO substrate using the radio-frequency magnetron sputtering technique.

View Article and Find Full Text PDF

Integrating nanocrystalline diamond (NCD) films on silicon chips has great practical significance and many potential applications, including high-power electronic devices, microelectromechanical systems, optoelectronic devices, and biosensors. In this study, we provide a solution for ensuring heterogeneous interface integration between silicon (Si) chips and NCD films using low-temperature bonding technology. This paper details the design and implementation of a magnetron sputtering layer on an NCD surface, as well as the materials and process for the connection layer of the integrated interface.

View Article and Find Full Text PDF

Annealing Effect on Linear and Ultrafast Nonlinear Optical Properties of BiTe Thin Films.

Materials (Basel)

December 2024

Department of Optical Science and Engineering, Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China.

In recent years, the fabrication of materials with large nonlinear optical coefficients and the investigation of methods to enhance nonlinear optical performance have been in the spotlight. Herein, the bismuth telluride (BiTe) thin films were prepared by radio-frequency magnetron sputtering and annealed in vacuum at various temperatures. The structural and optical properties were characterized and analyzed using X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy, spectroscopic ellipsometry, and UV/VIS/NIR spectrophotometry.

View Article and Find Full Text PDF

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!