Ni(II) ions have been deposited on the Zr nodes of a metal-organic framework (MOF), UiO-66, via an ALD-like process (ALD = atomic layer deposition). By varying the number of ALD cycles, three Ni-decorated UiO-66 materials were synthesized. A suite of physical methods has been used to characterize these materials, indicating structural and high-surface-area features of the parent MOF are retained. Elemental analysis via X-ray photoelectron spectroscopy (XPS) indicates that the anchored Ni ions are mainly on surface and near-surface MOF defect sites. Upon activation, all three materials are catalytic for ethylene hydrogenation, but their catalytic activities significantly vary, with the largest clusters displaying the highest per-nickel-atom activity. The study highlights the ease and effectiveness ALD in MOFs (AIM) for synthesizing, specifically, UiO-66-supported NiO catalysts.

Download full-text PDF

Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5645048PMC
http://dx.doi.org/10.1039/C7QI00056ADOI Listing

Publication Analysis

Top Keywords

atomic layer
8
layer deposition
8
ethylene hydrogenation
8
size active
4
active sites
4
sites uio-66-supported
4
uio-66-supported nickel
4
nickel catalysts
4
catalysts synthesized
4
synthesized atomic
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!