Effects of Bilayer Thickness on the Morphological, Optical, and Electrical Properties of AlO/ZnO Nanolaminates.

Nanoscale Res Lett

Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Department of Optical Science and Engineering, Fudan University, Shanghai, 200433, China.

Published: October 2017

AI Article Synopsis

  • The report investigates the properties of AlO/ZnO nanolaminates by changing their bilayer thickness, focusing on their morphology, optical characteristics, and electrical behaviors.
  • It reveals that surface roughness can be controlled through the smooth interposition of AlO layers, and various measurements provide insights into thickness, optical constants, and bandgap.
  • The findings indicate a blue shift in bandgap and absorption edge with reduced bilayer thickness due to effects like Burstein-Moss and quantum confinement, highlighting their importance for applications in transparent conductors and high-resistance layers in optoelectronics.

Article Abstract

This report mainly focuses on the investigation of morphological, optical, and electrical properties of AlO/ZnO nanolaminates regulated by varying bilayer thicknesses. The growth mechanism of nanolaminates based on atomic layer deposition and Al penetration into ZnO layer are proposed. The surface roughness of AlO/ZnO nanolaminates can be controlled due to the smooth effect of interposed AlO layers. The thickness, optical constants, and bandgap information of nanolaminates have been investigated by spectroscopic ellipsometry measurement. The band gap and absorption edge have a blue shift with decreasing the bilayer thickness on account of the Burstein-Moss effect, the quantum confinement effect and the characteristic evolution of nanolaminates. Also, the carrier concentrations and resistivities are found to be modified considerably among various bilayer thicknesses. The modulations of these properties are vital for AlO/ZnO nanolaminates to be used as transparent conductor and high resistance layer in optoelectronic applications.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5636778PMC
http://dx.doi.org/10.1186/s11671-017-2328-xDOI Listing

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