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Electrically Driven Reversible Phase Changes in Layered In Se Crystalline Film. | LitMetric

Electrically Driven Reversible Phase Changes in Layered In Se Crystalline Film.

Adv Mater

SKKU Advanced Institute of Nano-Technology (SAINT), Sungkyunkwan University, 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do, 16419, Korea.

Published: November 2017

AI Article Synopsis

  • A new type of phase-change memory (PCM) using Indium Selenide (In Se) is introduced, highlighting reversible phase changes between a low-resistance β phase and a high-resistance γ phase.
  • The PCM employs a layered crystalline film of In Se on a graphene electrode, with unique behavior caused by the formation and removal of van der Waals gaps in the atomic layers, resulting in a programmable memory function.
  • Density functional theory calculations reveal different energy bandgap values for the β and γ phases, indicating a metal-to-insulator transition during the phase change, and suggesting a more efficient and low-entropy approach compared to traditional materials like GeTe-SbTe.

Article Abstract

An unconventional phase-change memory (PCM) made of In Se , which utilizes reversible phase changes between a low-resistance crystalline β phase and a high-resistance crystalline γ phase is reported for the first time. Using a PCM with a layered crystalline film exfoliated from In Se crystals on a graphene bottom electrode, it is shown that SET/RESET programmed states form via the formation/annihilation of periodic van der Waals' (vdW) gaps (i.e., virtual vacancy layers) in the stack of atomic layers and the concurrent reconfiguration of In and Se atoms across the layers. From density functional theory calculations, β and γ phases, characterized by octahedral bonding with vdW gaps and tetrahedral bonding without vdW gaps, respectively, are shown to have energy bandgap value of 0.78 and 1.86 eV, consistent with a metal-to-insulator transition accompanying the β-to-γ phase change. The monolithic In Se layered film reported here provides a novel means to achieving a PCM based on melting-free, low-entropy phase changes in contrast with the GeTe-Sb Te superlattice film adopted in interfacial phase-change memory.

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Source
http://dx.doi.org/10.1002/adma.201703568DOI Listing

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