AI Article Synopsis

  • Electron microscopy surpasses optical microscopy by providing higher resolution and the ability to reveal electric and magnetic features of specimens due to the properties of electrons.
  • Using the Lorentz force allows experimental study of in-plane magnetic structures, although full magnetic field mapping has been challenging.
  • Grillo et al. introduce a method combining electron vortex beams and holographic detection to successfully measure nanoscale out-of-plane magnetic fields without needing to tilt the specimen.

Article Abstract

Electron waves give an unprecedented enhancement to the field of microscopy by providing higher resolving power compared to their optical counterpart. Further information about a specimen, such as electric and magnetic features, can be revealed in electron microscopy because electrons possess both a magnetic moment and charge. In-plane magnetic structures in materials can be studied experimentally using the effect of the Lorentz force. On the other hand, full mapping of the magnetic field has hitherto remained challenging. Here we measure a nanoscale out-of-plane magnetic field by interfering a highly twisted electron vortex beam with a reference wave. We implement a recently developed holographic technique to manipulate the electron wavefunction, which gives free electrons an additional unbounded quantized magnetic moment along their propagation direction. Our finding demonstrates that full reconstruction of all three components of nanoscale magnetic fields is possible without tilting the specimen.Beyond high resolving power, electron microscopy can be used to study both the electronic and magnetic properties of a sample. Here, Grillo et al. combine electron vortex beams with holographic detection to measure out-of-plane nanoscale magnetic fields.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5613010PMC
http://dx.doi.org/10.1038/s41467-017-00829-5DOI Listing

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