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Identifying the Crystalline Orientation of Black Phosphorus by Using Optothermal Raman Spectroscopy. | LitMetric

Identifying the Crystalline Orientation of Black Phosphorus by Using Optothermal Raman Spectroscopy.

Chemphyschem

Department of Mechanical Engineering, Iowa State University, 2025 Black Engineering Building, Ames, IA, 50010, USA.

Published: October 2017

AI Article Synopsis

  • - Current methods for determining the crystalline orientation of black phosphorus using polarized Raman techniques are unreliable due to interference from various factors like laser wavelength and sample thickness.
  • - A new method called optothermal Raman spectroscopy (OT-Raman) is introduced, which utilizes the unique optical absorption properties of polarized lasers and the resulting heating effects to accurately identify crystalline orientation.
  • - The OT-Raman technique can effectively assess crystalline orientation for black phosphorus samples with thicknesses ranging from a minimum of 300 nm to potentially as much as 1200 nm, illustrating its robustness and versatility.

Article Abstract

Current polarized Raman-based techniques for identifying the crystalline orientation of black phosphorus suffer significant uncertainty and unreliability because of the complex interference involving excitation laser wavelength, scattering light wavelength, and sample thickness. Herein, for the first time, we present a new method, optothermal Raman spectroscopy (OT-Raman), for identifying crystalline orientation. With a physical mechanism based on the anisotropic optical absorption of the polarized laser and the resulting heating, the OT-Raman can identify the crystalline orientation explicitly, regardless of excitation wavelength and sample thickness, by Raman frequency-power differential Φ (=∂ω/∂P). The parameter Φ has the largest (smallest) value when the laser polarization is along the armchair (zigzag) direction. The OT-Raman technique is robust and is able to identify the crystalline orientation of BP samples with thicknesses up to 300 nm at a minimum and potentially as high as 1200 nm.

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Source
http://dx.doi.org/10.1002/cphc.201700788DOI Listing

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