Edge-illumination x-ray phase contrast imaging (EI XPCI) is a non-interferometric phase-sensitive method where two absorption masks are employed. These masks are fabricated through a photolithography process followed by electroplating which is challenging in terms of yield as well as time- and cost-effectiveness. We report on the first implementation of EI XPCI with Pt-based metallic glass masks fabricated by an imprinting method. The new tested alloy exhibits good characteristics including high workability beside high x-ray attenuation. The fabrication process is easy and cheap, and can produce large-size masks for high x-ray energies within minutes. Imaging experiments show a good quality phase image, which confirms the potential of these masks to make the EI XPCI technique widely available and affordable.
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X-ray imaging is becoming more commonplace for inline industrial inspection, where a sample placed on a conveyor belt is translated through a scanning setup. However, the conventional X-ray attenuation contrast is often insufficient to characterize soft materials such as polymers and carbon reinforced components. Edge illumination (EI) is an X-ray phase contrast imaging technique that provides complementary differential phase and dark field contrasts, next to attenuation contrast.
View Article and Find Full Text PDFPhase contrast micro-CT with adjustable in-slice spatial resolution at constant magnification.
Phys Med Biol
May 2024
University College London, Department of Medical Physics and Biomedical Engineering, London, United Kingdom.
To report on a micro computed tomography (micro-CT) system capable of x-ray phase contrast imaging and of increasing spatial resolution at constant magnification.The micro-CT system implements the edge illumination (EI) method, which relies on two absorbing masks with periodically spaced transmitting apertures in the beam path; these split the beam into an array of beamlets and provide sensitivity to the beamlets' directionality, i.e.
View Article and Find Full Text PDFEdge illumination x-ray phase contrast imaging (XPCI) provides increased contrast for low absorbing materials compared to attenuation images and sheds light on the material microstructure through dark field contrast. To apply XPCI in areas such as non-destructive testing and inline inspection, where scanned samples are increasingly compared to simulated reference images, accurate and efficient simulation software is required. However, currently available simulators rely on expensive Monte Carlo techniques or wave-optics frameworks, resulting in long simulation times.
View Article and Find Full Text PDFEdge-illumination spectral phase-contrast tomography.
Phys Med Biol
April 2024
Department of Medical Physics and Biomedical Engineering, University College London, Gower Street, GWC1E 6BT, London, United Kingdom.
Following the rapid, but independent, diffusion of x-ray spectral and phase-contrast systems, this work demonstrates the first combination of spectral and phase-contrast computed tomography (CT) obtained by using the edge-illumination technique and a CdTe small-pixel (62m) spectral detector. A theoretical model is introduced, starting from a standard attenuation-based spectral decomposition and leading to spectral phase-contrast material decomposition. Each step of the model is followed by quantification of accuracy and sensitivity on experimental data of a test phantom containing different solutions with known concentrations.
View Article and Find Full Text PDFEdge illumination (EI) is an X-ray imaging technique that, in addition to conventional absorption contrast, provides refraction and scatter contrast. It relies on an absorption mask in front of the sample that splits the X-ray beam into beamlets, which hits a second absorption mask positioned in front of the detector. The sample mask is then shifted in multiple steps with respect to the detector mask, thereby measuring an illumination curve per detector element.
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