AI Article Synopsis
- A new method combines atomic force microscopy (AFM) and surface-enhanced Raman spectroscopy (SERS) to rapidly assess both the structure and chemistry of reactive surfaces.
- This technique utilizes an alignment pattern on the substrate for precise image registration, allowing detailed scans of a 100x100 µm area with sub-micron resolution in just 30 minutes.
- The method enables a comprehensive analysis of surface reactivity using a minimal amount of reactant, demonstrated by studying the catalytic reduction of p-nitrothiophenol on a specially prepared SERS substrate.
Article Abstract
A fast high-resolution screening method for reactive surfaces is presented. Atomic force microscopy (AFM) and surface-enhanced Raman spectroscopy (SERS) are combined in one method in order to be able to obtain both morphological and chemical information about processes at a surface. In order to accurately align the AFM and SERS images, an alignment pattern on the substrate material is exploited. Subsequent SERS scans with sub-micron resolution are recorded in 30 min per scan for an area of 100 × 100 µm and are accompanied by morphological information, supplied by a fast AFM, of the same area. Hence, a complete reactivity overview is obtained within several hours with only a monolayer of reactant. To demonstrate the working principle of this method, a SERS substrate containing the alignment pattern and silver nanoparticle aggregates as catalytic sites is prepared to study the photo-catalytic reduction of p-nitrothiophenol ( p-NTP).
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| http://dx.doi.org/10.1177/0003702816683528 | DOI Listing |
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