AI Article Synopsis
- Understanding nanoscale structure dynamics on cell surfaces is crucial for grasping cell functions, and hopping-mode scanning ion conductance microscopy (SICM) is utilized for this purpose without damaging the cells.
- Traditional SICM has limitations in temporal resolution due to the time it takes for the nanopipette to move up and down.
- A new high-speed scanning algorithm has been developed that allows for quicker imaging of cell surfaces, successfully capturing microvilli dynamics and their structural changes after stimulation with epidermal growth factor.
Article Abstract
Observation of nanoscale structure dynamics on cell surfaces is essential to understanding cell functions. Hopping-mode scanning ion conductance microscopy (SICM) was used to visualize the topography of fragile convoluted nanoscale structures on cell surfaces under noninvasive conditions. However, conventional hopping mode SICM does not have sufficient temporal resolution to observe cell-surface dynamics in situ because of the additional time required for performing vertical probe movements of the nanopipette. Here, we introduce a new scanning algorithm for high speed SICM measurements using low capacitance and high-resonance-frequency piezo stages. As a result, a topographic image is taken within 18 s with a 64 × 64 pixel resolution at 10 × 10 μm. The high speed SICM is applied to the characterization of microvilli dynamics on surfaces, which shows clear structural changes after the epidermal growth factor stimulation.
Download full-text PDF |
Source |
|---|---|
| http://dx.doi.org/10.1021/acs.analchem.7b00584 | DOI Listing |
Publication Analysis
Top Keywords
Similar Publications
Want AI Summaries of new PubMed Abstracts delivered to your In-box?
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!