Potential-modulated attenuated total reflectance (PM-ATR) spectroscopy is a spectroelectrochemical method that utilizes the potential modulation approach and a waveguide ATR geometry. This unique combination enables measurements of electron-transfer (ET) kinetics of monolayer to submonolayer thin films on waveguide electrode surfaces. Selective probing of molecular subpopulations in a film can be achieved by choosing appropriate combinations of applied potential, wavelength, and polarization of light, which allows subpopulation structure to be correlated with ET kinetics. In this review, the basic theory of PM-ATR is introduced, and examples illustrating characterization of the structure and ET kinetics of organic semiconductor monolayers on electrode surfaces are presented, demonstrating the capabilities and applications of the PM-ATR technique.

Download full-text PDF

Source
http://dx.doi.org/10.2116/analsci.33.427DOI Listing

Publication Analysis

Top Keywords

potential-modulated attenuated
8
attenuated total
8
total reflectance
8
reflectance pm-atr
8
pm-atr spectroscopy
8
electrode surfaces
8
characterization charge-transfer
4
kinetics
4
charge-transfer kinetics
4
kinetics organic/electrode
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!