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Nanoselective area growth of defect-free thick indium-rich InGaN nanostructures on sacrificial ZnO templates. | LitMetric

AI Article Synopsis

  • NSAG technique produces high-quality InGaN nanopyramids on GaN-coated ZnO/c-sapphire with uniform, single crystalline structures.
  • These nanopyramids feature 22% indium incorporation and a thickness of 100 nm, making them comparable to structures on GaN and AlN/Si templates.
  • The selective etching capability of ZnO allows for transferring these nanostructures to alternative, potentially cheaper substrates, providing a new avenue for developing flexible and tunable light-emitting diodes.

Article Abstract

Nanoselective area growth (NSAG) by metal organic vapor phase epitaxy of high-quality InGaN nanopyramids on GaN-coated ZnO/c-sapphire is reported. Nanopyramids grown on epitaxial low-temperature GaN-on-ZnO are uniform and appear to be single crystalline, as well as free of dislocations and V-pits. They are also indium-rich (with homogeneous 22% indium incorporation) and relatively thick (100 nm). These properties make them comparable to nanostructures grown on GaN and AlN/Si templates, in terms of crystallinity, quality, morphology, chemical composition and thickness. Moreover, the ability to selectively etch away the ZnO allows for the potential lift-off and transfer of the InGaN/GaN nanopyramids onto alternative substrates, e.g. cheaper and/or flexible. This technology offers an attractive alternative to NSAG on AlN/Si as a platform for the fabrication of high quality, thick and indium-rich InGaN monocrystals suitable for cheap, flexible and tunable light-emitting diodes.

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Source
http://dx.doi.org/10.1088/1361-6528/aa6a43DOI Listing

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