AI Article Synopsis
- An algorithm has been developed to enhance both the spatial and statistical accuracy of X-ray Raman scattering (XRS) imaging.
- This new tomography technique utilizes XRS spectroscopy as a means to examine local atomic structures and chemistry in varied samples.
- The algorithm improves image quality by deconvolving the optical response of the spectrometer and combining data from multiple analyzers for better statistical reliability.
Article Abstract
An algorithm to simultaneously increase the spatial and statistical accuracy of X-ray Raman scattering (XRS) based tomographic images is presented. Tomography that utilizes XRS spectroscopy signals as a contrast for the images is a new and promising tool for investigating local atomic structure and chemistry in heterogeneous samples. The algorithm enables the spatial resolution to be increased based on a deconvolution of the optical response function of the spectrometer and, most importantly, it allows for the combination of data collected from multiple analyzers and thus enhances the statistical accuracy of the measured images.
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| http://dx.doi.org/10.1107/S1600577517000169 | DOI Listing |
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