Due to the polarization nature of the transverse electric electromagnetic wave, manipulating it has been a difficult task and can be even more challenging for integrated on-chip optics. In this Letter, a transverse electric wave manipulating method based on direct wavefront bending and its physical picture have been proposed. Even with only five cells, the microlens can exhibit a focusing pattern and retrieve sub-wavelength spatial features. An analytical mode has been proposed to help understand the physical picture and verify the result. This Letter facilitates the basic understanding for transverse electric wave manipulating and the design of integrated optical elements.
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| http://dx.doi.org/10.1364/OL.41.005632 | DOI Listing |
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