Control of secondary electrons from ion beam impact using a positive potential electrode.

Rev Sci Instrum

Xantho Technologies, LLC, Madison, Wisconsin 53705, USA.

Published: November 2016

Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.

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Source
http://dx.doi.org/10.1063/1.4960170DOI Listing

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