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Effects of van der Waals Force and Thermal Stresses on Pull-in Instability of Clamped Rectangular Microplates. | LitMetric

Effects of van der Waals Force and Thermal Stresses on Pull-in Instability of Clamped Rectangular Microplates.

Sensors (Basel)

The Bradley Department of Electrical & Computer Engineering, Virginia Polytechnic Institute & State University, Blacksburg, VA 24061, USA.

Published: February 2008

We study the influence of von Karman nonlinearity, van der Waals force, and a athermal stresses on pull-in instability and small vibrations of electrostatically actuated mi-croplates. We use the Galerkin method to develop a tractable reduced-order model for elec-trostatically actuated clamped rectangular microplates in the presence of van der Waals forcesand thermal stresses. More specifically, we reduce the governing two-dimensional nonlineartransient boundary-value problem to a single nonlinear ordinary differential equation. For thestatic problem, the pull-in voltage and the pull-in displacement are determined by solving apair of nonlinear algebraic equations. The fundamental vibration frequency corresponding toa deflected configuration of the microplate is determined by solving a linear algebraic equa-tion. The proposed reduced-order model allows for accurately estimating the combined effectsof van der Waals force and thermal stresses on the pull-in voltage and the pull-in deflectionprofile with an extremely limited computational effort.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC3927533PMC
http://dx.doi.org/10.3390/s8021048DOI Listing

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