Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2-3, 1995.

J Res Natl Inst Stand Technol

Code 6177 Naval Research Laboratory, Washington, DC 20375.

Published: January 1996

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907606PMC
http://dx.doi.org/10.6028/jres.101.009DOI Listing

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