Wurtzite gallium phosphide (WZ GaP) has been predicted to exhibit a direct bandgap in the green spectral range. Optical transitions, however, are only weakly allowed by the symmetry of the bands. While efficient luminescence has been experimentally shown, the nature of the transitions is not yet clear. Here we apply tensile strain up to 6% and investigate the evolution of the photoluminescence (PL) spectrum of WZ GaP nanowires (NWs). The pressure and polarization dependence of the emission together with a theoretical analysis of strain effects is employed to establish the nature and symmetry of the transitions. We identify the emission lines to be related to localized states with significant admixture of Γ7c symmetry and not exclusively related to the Γ8c conduction band minimum (CBM). The results emphasize the importance of strongly bound state-related emission in the pseudodirect semiconductor WZ GaP and contribute significantly to the understanding of the optoelectronic properties of this novel material.
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http://dx.doi.org/10.1021/acs.nanolett.6b01038 | DOI Listing |
Materials (Basel)
November 2024
CREOL, The College of Optics and Photonics, University of Central Florida, 4304 Scorpius St., Orlando, FL 32816, USA.
ACS Appl Mater Interfaces
November 2024
NEST Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza S. Silvestro 12, 56127 Pisa, Italy.
Materials (Basel)
June 2024
State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China.
GaN on Si plays an important role in the integration and promotion of GaN-based wide-gap materials with Si-based integrated circuits (IC) technology. A series of GaN film materials were grown on Si (111) substrate using a unique plasma assistant molecular beam epitaxy (PA-MBE) technology and investigated using multiple characterization techniques of Nomarski microscopy (NM), high-resolution X-ray diffraction (HR-XRD), variable angular spectroscopic ellipsometry (VASE), Raman scattering, photoluminescence (PL), and synchrotron radiation (SR) near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. NM confirmed crack-free wurtzite (w-) GaN thin films in a large range of 180-1500 nm.
View Article and Find Full Text PDFHeliyon
June 2024
Department of Electrical and Electronic Engineering, Jashore University of Science and Technology (JUST), Jashore, 7408, Bangladesh.
The purpose of this study is to investigate the possibilities of the junction-less double-gate (JLDG) MOSFET structure with gallium nitride (GaN) channel material to overcome the limitations of conventional MOSFET structures in improving device performance at scaled gate lengths and voltages. The design targets of this study are the doping profile (N), and gate work function (Ф). The device has been modeled using the Silvaco Atlas 2D device simulator.
View Article and Find Full Text PDFJ Phys Condens Matter
May 2024
V. E. Lashkaryov Institute of Semiconductor Physics National Academy of Sciences of Ukraine, Kyiv, Ukraine.
Analytical expressions for the low-field mobility of charge carrier gases with three-(3D), two-(2D) and one-(1D) dimensionalities are obtained. Multi-ion ionized impurities scattering, acoustic and polar optic phonons are considered as scattering mechanisms. The calculated values of mobility are compared to known experimental data for bulk (3D) n-and p-type wurtzite, n-type zinc-blende GaN crystals and low dimensional (2D and 1D) ternary GaAlN compounds.
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