XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam.

Biointerphases

Physical Electronics, Inc., 17825 Lake Drive East, Chanhassen, Minnesota 55317.

Published: June 2016

The growing interest in artificial bioorganic interfaces as a platform for applications in emerging areas as personalized medicine, clinical diagnostics, biosensing, biofilms, prevention of biofouling, and other fields of bioengineering is the origin of a need for in detail multitechnique characterizations of such layers and interfaces. The in-depth analysis of biointerfaces is of special interest as the properties of functional bioorganic coatings can be dramatically affected by in-depth variations of composition. In worst cases, the functionality of a device produced using such coatings can be substantially reduced or even fully lost.

Download full-text PDF

Source
http://dx.doi.org/10.1116/1.4948341DOI Listing

Publication Analysis

Top Keywords

xps depth
4
depth profiling
4
profiling ultrathin
4
ultrathin bioorganic
4
bioorganic film
4
film argon
4
argon gas
4
gas cluster
4
cluster ion
4
ion beam
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!