AI Article Synopsis
- The text outlines a method for predicting the output parameters of (63)Ni-based betavoltaic batteries using multilayer Monte Carlo simulations to analyze excess carrier generation rates in the semiconductor converter.
- It includes measuring collection probability through electron beam induced current, calculating current induced by beta-radiation, and employing scanning electron microscopy (SEM) for output parameter measurements.
- This approach enables accurate predictions and optimizations of betavoltaic battery designs for various semiconductor structures and beta-radiation sources.
Article Abstract
An approach for a prediction of (63)Ni-based betavoltaic battery output parameters is described. It consists of multilayer Monte Carlo simulation to obtain the depth dependence of excess carrier generation rate inside the semiconductor converter, a determination of collection probability based on the electron beam induced current measurements, a calculation of current induced in the semiconductor converter by beta-radiation, and SEM measurements of output parameters using the calculated induced current value. Such approach allows to predict the betavoltaic battery parameters and optimize the converter design for any real semiconductor structure and any thickness and specific activity of beta-radiation source.
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| http://dx.doi.org/10.1016/j.apradiso.2016.03.023 | DOI Listing |
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