AI Article Synopsis
- The focused ion beam scanning electron microscope (FIB-SEM) has been used for over 20 years to prepare thin lamellae from bulk samples for transmission electron microscopy (TEM) using a method called lift-out.
- Recent advancements have allowed for the successful lift-out of high-water content biological samples under cryogenic conditions, enhancing techniques established by previous research.
- The paper discusses strategies for maintaining cryogenic conditions, attaching samples to grids through cryo-condensation, and protecting lamellae during the transfer to the TEM.
Article Abstract
The preparation of thinned lamellae from bulk samples for transmission electron microscopy (TEM) analysis has been possible in the focussed ion beam scanning electron microscope (FIB-SEM) for over 20 years via the in situ lift-out method. Lift-out offers a fast and site specific preparation method for TEM analysis, typically in the field of materials science. More recently it has been applied to a low-water content biological sample (Rubino 2012). This work presents the successful lift-out of high-water content lamellae, under cryogenic conditions (cryo-FIB lift-out) and using a nanomanipulator retaining its full range of motion, which are advances on the work previously done by Rubino (2012). Strategies are explored for maintaining cryogenic conditions, grid attachment using cryo-condensation of water and protection of the lamella when transferring to the TEM.
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| http://dx.doi.org/10.1002/jemt.22630 | DOI Listing |
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