AI Article Synopsis
- - Ellipsometry was employed to analyze how light interacts with a thin film of CH3NH3PbI3 (MAPI), an organic-inorganic hybrid perovskite, on a silicon wafer.
- - The study measured the amplitude ratio and phase shift of the light, which helps understand the optical properties of the material.
- - A multi-oscillator model was used to determine the refractive index and extinction coefficient across a wavelength range of 300 to 1500 nm from the collected data.
Article Abstract
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.
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Source |
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669473 | PMC |
| http://dx.doi.org/10.1016/j.dib.2015.10.026 | DOI Listing |
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